This system is used for comprehensive electrical and electro-mechanical characterization of piezoelectric bulk ceramic samples. Large and small signal material characteristics can be evaluated over a wide temperature range. The samples current response is measured by applying an electrical voltage excitation signal using the flexible and precise virtual ground method. The samples displacement is simultaneously measured with an laser interferometer system.
Application
Material characterization for research and development
Device qualification
Large and small signal measurements
Temperature dependent measurements
Reliability and fatigue tests
Leakage measurements
Highlights/Benefits
One system for comprehensive evaluation of piezo- and ferroelectric thin films, bulk materials, and sensor and actuator devices
One software for external hardware control (e.g. temperature controller, high voltage amplifier, displacement sensor, oscilloscope) and data acquisition
Remote access and script control available
Optional database connection (ODBC) for easy access on material / device characteristics
Adaption to customers' hardware and customer specific requirements
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